Inside FALP®

Two Atomic-Scale Processes.
One Chamber.

plasway-Technologies' FAST Atomic Layer Process (FALP) integrates Atomic Layer Etching (ALE) and Plasma Enhanced Atomic Layer Deposition (PEALD) in a single chamber — switching gases at high speed while holding perfect uniformity across the wafer.

500 mmDual-channel ceramic Gas-Ring
<3%SiO₂ non-uniformity, 17″ substrates
≤ 120°CAll PEALD & ALE Process Temperature
3,600 L/sTurbomolecular pump throughput
FALP lid assembly with mounted large-diameter gas distribution ring
The FALP® Platform

Bringing Speed and Precision Into the Same Chamber

The semiconductor industry's pursuit of faster, more uniform Atomic Layer Deposition (ALD) and Atomic Layer Etching (ALE) demanded gas-distribution hardware that conventional showerhead designs simply couldn't deliver. FALP — our FAST Atomic Layer Process — was built to solve exactly that.

Why speed is the bottleneck

Gases must be brought in efficiently, distributed fast and uniformly across the wafer surface, and then removed quickly again. A low residence time with the fastest possible gas exchange is the key to performance — in both ALE and PEALD.

Two independent gas channels

A strictly separated dual-channel design keeps precursor and co-reactant gases from ever interacting before they enter the chamber — eliminating the need to purge shared interaction volumes between pulses.

Process

Atomic Layer Etching (ALE)

Atomic layer etching (ALE) is a cyclic, self-limiting nanofabrication technique that removes material in controlled, near-atomic increments. It alternates between modifying only the topmost surface layer and then selectively removing that modified layer, repeating the cycle until the desired depth is reached.

SEM image showing isotropic critical dimension trimming from 200-700nm down to approximately 200nm

Typical cycle

  1. Surface modification: A precursor chemically alters the top surface layer, making it easier to remove.
  2. Purge: Residual reactants and by-products are removed to prevent unwanted reactions.
  3. Removal: Ions, energetic neutrals, photons, or a chemical reaction remove only the modified layer, leaving the underlying material intact.
  4. Result: The amount removed is measured as etch per cycle (EPC). In practice, it is often close to, but not necessarily exactly, one atomic monolayer per cycle.

Why it is used ?

ALE provides exceptional depth control, high selectivity, smooth surfaces, and reduced damage compared with continuous etching. These qualities make it important for advanced semiconductor devices, especially as critical feature dimensions approach the single-digit-nanometer scale.

FALP : Isotropic CD Trimming Results -

FALP performs isotropic critical-dimension (CD) trimming, stepping resist structures with initial dimensions of ~700nm down to approximately 200nm without breaking vacuum

"Both processes have their individual challenges in precursor behaviour, but in both cases it is key to control the gases uniformly and quickly. A low residence time with the fastest possible gas exchange is the key to improving performance."

STEPHAN WEGE — CEO & Founder, plasway-Technologies GmbH

ALE + PEALD, In Situ

Native oxide can be removed via ALE, then multiple PEALD layers deposited immediately after — all inside the same chamber, without a vacuum break.

High Aspect Ratio Performance:

FALP has produced excellent electrical results as Conductive barrier in High aspect ratio Structure of 25-30.

Full Stack in 15 Minutes

A complete capacitor stack — insulating, conductive and barrier layers — fabricated in a single chamber without a vacuum break, completed in just 15 minutes.

Process

Plasma Enhanced Atomic Layer Deposition (PEALD)

ALD builds ultra-thin, highly conformal coatings one self-limiting cycle at a time. PEALD adds a plasma step to that cycle — enabling lower deposition temperatures and significantly faster throughput.

First-generation 380mm FALP ring with dual-channel precursor gas injection nozzles

Why PEALD instead of thermal ALD?

In PEALD, plasma generates reactive radicals, ions, and photons that activate precursors and co-reactants, allowing high-quality film growth at substantially lower substrate temperatures. This is essential for advanced semiconductor structures that cannot tolerate high-temperature processing. Plasma chemistry also expands the range of possible materials, improves ligand removal and film density, and enables tuning of composition, stoichiometry, stress, and microstructure through plasma power, gas chemistry, exposure time, and bias. In addition, its higher reactivity can shorten reaction times and increase deposition rates, improving throughput.

 PEALD is preferred over thermal ALD when a process requires a lower thermal budget, faster surface reactions, or chemistry that thermal ALD cannot readily achieve.

Two channels, zero cross-contamination

The dual-channel ring guarantees a strictly independent and perfectly uniform tangential flow of precursor and co-reactant into the chamber at the highest possible speed — while still forming a perfectly symmetrical laminar flow across the wafer.

Process Performance

Verified, Repeatable Uniformity

Comparison of ALD deposition uniformity in the FALP chamber - early uneven ring design versus improved uniform design Comparison of ALD deposition uniformity in the FALP chamber - early uneven ring design versus improved uniform design

Process Qualification:

FALP’s performance is closely monitored and requalified using standard methods after certain intervals. The outcomes are evaluated through various metrological measurements such as ellipsometry, AFM, SEM, TEM , EDX and XPS. The tool has showcased stable and reliable results over the years. With adequate tool maintenance and appropriate process executions, the tool maintains its standard functioning even while switching between different PEALD & ALE processes.

Bipolar Electrostatic Chuck

Our own ESC for 300mm wafer, paired with High Voltage module and backside helium supply, gives independent control of plasma density, ion energy and wafer temperature.

Polycrystalline Film Control

Careful ion-energy control during PEALD produces polycrystalline rather than amorphous films — researched jointly with the IFW Leibniz Institute, Dresden.

Double Patterning

Al₂O₃ can be deposited directly onto resist at temperatures as low as 20°C, leaving ~50 nm aluminium-oxide hard-mask structures after resist strip.

Enabling Hardware

The Ceramic Gas Distribution Ring

Two intricate, non-intersecting channel systems inside a single ceramic structure — a design far beyond slip casting, injection moulding or dry pressing. Built instead with Lithoz ceramic Additive Manufacturing in 99.9%-purity alumina, for its resistance to plasma corrosion.

A large alumina gas distribution ring developed for high-speed PEALD and ALE, shown at scale

Why alumina, why additive manufacturing

A conventionally produced metal ring would corrode far faster under FALP's aggressive plasma chemistry. 99.9%-purity Al₂O₃ was identified as the best compromise — but the Laval-type nozzle geometries needed, optimised through computational fluid dynamics, could only be realised with a mature ceramic AM process.

The result: tested ring uptime increased from one month to nine, while production output tripled — compared to an equivalent metal ring.

01

Monolithic + AM Nozzles

380 mm slip-cast core with additively manufactured nozzles; tested in a clean-room CCP reactor at Fraunhofer IKTS, Dresden.

02

Fully Additive Ring

Entire ring 3D-printed as a single piece via Vat Photopolymerisation, eliminating joints between ring and nozzles.

03

Segmentation

Split into six bonded segments to cut warpage risk, reduce scrap, and let Lithoz LCM push channel precision even further.

04

500 mm Diameter

Scaled to eight segments per ring for 430 mm substrates, with integrated stainless-steel gas inlets from Alumina Systems.

"This dual-channel gas distribution ring opens up so many fascinating possibilities. The FALP machine has packed two key processes in wafer production into the same chamber."

STEPHAN WEGE — CEO & Founder, plasway-Technologies GmbH
Partner Technology

Vacuum Performance & Long-Term Reliability

Fast gas exchange means nothing without equally fast evacuation. The turbomolecular pump keeps every ALE/PEALD half-cycle cleanly separated from the next.

Edwards STP-iXA3306CV turbomolecular pump

Sub-100ms pressure transitions

Pressure transition data from the FALP process shows chamber pressure falling from the gas shoot-in peak to plasma operating pressure in approximately 100 ms — the combined result of the turbo pump and fast slot-valve actuation, reaching high-vacuum pressures in the 10−7 bar range.

Four years, fully operational

After four years of continuous experimentation inside the PEALD environment, the pump remains fully operational — direct proof that turbomolecular vacuum technology can withstand sustained, harsh plasma process conditions.

Edwards turbomolecular pump installed beneath the plasway-Technologies FALP chamber

Full diagnostic visibility

The STP Link diagnostic interface tracks total pump operating hours, controller operating hours, start counts and a rolling failure history — letting our maintenance engineers spot recurring faults and support root-cause analysis before they ever affect a customer's process.

STP Link diagnostic software showing pump identification, operating statistics and failure history
2,744 hTotal pump operating hours logged
4 yrsContinuous PEALD-environment operation
~100 msGas shoot-in to plasma pressure
10−7 barHigh-vacuum operating range

"Plasway Technologies has created the world's first integrated high-speed ALE/PEALD system with its FALP chamber — featuring two ultra-fast gas inlets, perfectly symmetric gas flow, and an Edwards turbo pump that together deliver exceptionally rapid gas exchange. A technological original that sets new benchmarks in ALE/PEALD processing."

STEPHAN WEGE — CEO & Founder, plasway-Technologies GmbH

See FALP® In Action

Book a live demo of our combined ALE/PEALD chamber, or talk to our team about adapting FALP to your substrate size and process requirements.