Metrology
Analytics
Every wafer or substrate that we ship is backed by data. We
perform customer specific processes and result qualification. Our
in-situ process parameter monitoring on every 10msec interval
provides assurance of stable and reliable execution. Our standard
analytical service includes -
- Ellipsometry Measurements
- AFM Measurements
- Optical Emission Spectroscopy measurements
- Cold plasma measurements Etc.
The quality assessment of the processed substrate can be
provided according to customer’s request which include XPS, TEM,
SEM, SAW, EDX. XRD, XRR etc.